| PART |
Description |
Maker |
| SDM-EVAL |
Test Fixture for Sirenza SDM Module Series
|
SIRENZA MICRODEVICES
|
| 0040.1012 0040.1013 0040.1015 0040.1011 0040.1014 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| CDS-425-CW-D CDS-425-CW-D-IP CDS-425-CW-M CDS-425- |
CD Series White LED Linear Fixture
|
Dialight Corporation
|
| CDS-425-RGB-W-P CDS-1190-RGB-V-P CDS-1190-RGB-D-P |
CD Series LED Linear RGB Fixture
|
Dialight Corporation
http://
|
| LSD3C4D2P |
SafeSite Series LED Linear Fixture
|
Dialight
|
| LSC3C4D3GEX LSC3C4M3GEX |
SafeSite Series LED Linear Fixture
|
Dialight Corporation
|
| 0690200710 |
Arbor Press Fixture, 10-60 Circuit, 28 AWG Ribbon Cable
|
Molex Electronics Ltd.
|
| 6470 |
Test Probe; Leaded Process Compatible:Yes; Peak Reflow Compatible (260 C):Yes RoHS Compliant: Yes INTERCONNECTION DEVICE
SMD Microtip Test Probe Set
|
Pomona Electronics
|
| IR-1891 |
Multiple product fixture assemblies give increased process rates
|
TE Connectivity Ltd
|
| 69020-0770 |
This fixture will terminate Molex Product 7660,7664,7674 and 7675.
|
Molex Electronics Ltd.
|
| HCTS393MS HCTS393KMSR HCTS393K HCTS393HMSR HCTS393 |
Radiation Hardened Dual 4-Input NOR Gate
Test Bus Controllers 68-CPGA -55 to 125
Test Bus Controllers 68-CFP -55 to 125
Radiation Hardened Octal D-Type Flip-Flop/ Three-State/ Positive Edge Triggered
Radiation Hardened Dual 4-Stage Binary Counter
From old datasheet system
|
INTERSIL[Intersil Corporation]
|
